Training


 
       
 

The following information is intended to facilitate access and use of the instruments.

Learning opportunities are provided in form of individual training on the instruments, workshops covering in-depth information about specific topics as well as classes which give a broader perspective on a particular technique. Additional resources will be provided in form of written tutorials, procedures and an extended bibliography of books and relevant articles (in preparation).


Acknowledgment

All users of the facility need to include the following statement under Acknowledgments in papers submitted for publication:

This work made use of MRL Central Facilities supported by the MRSEC Program of the National Science Foundation under award No. DMR 1121053

 
 
 
 

Access Learning Resources

 
  Access

Safety Training

As precondition for using the Microscopy Facility users need to be familiar with relevant safety regulations and register with the UC Lab Hazard Assessment Tool (LHAT). The following steps will guide you through the process:

Step 1

Every user has to have taken the general online safety training LS60 (Fundamentals of Laboratory Safety) at EH&S. Graduate students need to attend the corresponding live training ( LS01). Please check the link below for scheduling.

UCSB Environmental Health and Safety - Training Schedules
 
Step 2

Every user then needs to send an email to Tom Mates requesting an invitation to join the lab.

  Tom Mates mail

The invitation will provide a link to the LHAT website (see also link below), where you can log in using your UCSBnetID, and join our lab, the Microscopy Facility. (You can find it by searching for Tom Mates as the PI.)

UC Lab Hazard Assessment Tool
 
Step 3

After completion of the LHAT process please contact Tawny Hernandez in the office of the Materials Department to be added to the list of eligible users. Send her a copy of your proof of safety training, and request that she sends a TNA (training needs assessment) form to the lab facility manager who will be working with you.

  Tawny Hernandez mail
 
Step 4

Contact the responsible facility manager to set up a training on the desired instrument. At the beginning of the first session the manager will guide you through safety procedures that are relevant for the microscopy facility.



Lab Access

Users who are new to campus need to purchase a UC Access ID card at the University Center. (See the following link for more information).

Official University ID Card

The card can be purchased without further application. If the card is purchased by a Department via a UC account use the form below to provide the corresponding information:

UCSB Access ID Card Application

At the end of the training cycle users will be approved to apply for key access to the relevant doors which can be done using the following online access application form (the UC Access ID card number is needed here):

California NanoSystems Institute Access Application
 
 
 
 
  Learning

Individual Training

Basic training on instruments is done one-on-one and comprises typically three sessions. Please email the corresponding facility manager:

AFM, SEM Mark Cornish mail
FIB, TEM, Sample Preparation Aidan Taylor mail
Atom Probe, SIMS, XPS Tom Mates mail

Continued training will depend on the specific needs of the student. Please see below for general learning opportunities.

 
 
 
 
 

Classes

The list below gives an overview of up-coming classes that are related to work done in the facilities.

  Electron Microscopy II: Crystalline Materials Prof S. Stemmer T.B.D.

Electron microscopy is a versatile tool to analyze crystalline defects. This course will provide the underlying basic understanding of the quantum mechanical interaction of the electron beam with the material. Topics are:
 
[MATRL 209C] Electron microscopy to study defect structures, elastic and inelastic scattering, kinematic theory of image contrast, bright and dark field imaging, two-beam conditions, contrast from imperfections, dynamical theory of diffraction and image contrast. Howie Whellan equations, dispersion surface.

  X-Ray Diffraction II: Advanced Methods Prof J. Speck T.B.D.

X-ray diffraction is a complementary technique to electron microscopy. Many crystallographic aspects of beam-sample interation are equivalent.
 
[MATRL 2009B] Focuses on modern diffraction techniques from crystalline materials. High resolution x-ray diffraction. Analysis of epitaxial layers. X-ray scattering theory. Simulation of x-ray rocking curves. Analysis of thin films and multiple layers. Triple-axis x-ray diffractometry. Topography. Synchrotron techniques.

 
 
 
 
  Resources

Introductory Bibliography

The following list of books is intended to help novice users to get acquainted with the techniques available in the Microscopy Lab.


AFM

Atomic Force Microscopy
Peter Eaton, Paul West; Oxford University Press (2010)

 
APT

Local Electrode Atom Probe Tomography: A User's Guide
David J Larson, Ty J Prosa, Robert M Ulfig, Brian P Geiser, Thomas F Kelly; Springer (2013)

 
FIB

Introduction to Focused Ion Beam (Instrumentation, Theory, Techniques and Practices)
Edited by Lucille A Giannuzzi and Fred A Stevie; Springer (2005)

 
SEM

Scanning Electron Microscopy and X-Ray Microanalysis
Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Wasyer, Joseph Michaels; Springer (2007)

 
SIMS

Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
RG Stevie, CW Magee; John Wiley and Sons (1989)

 
TEM

Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set)
David B Williams, C Barry Carter; Springer (2009)

 
XPS

Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
D Briggs, JT Grant; IM Publications (2003)